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1
Admittance Spectroscopy on Irradiated GaAs Component Cells:..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Pellegrino, Carmine
;
Gagliardi, Alessio
;
Zimmermann, Claus G.
- p. 0156-0159 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9300890
RT T1
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
: T1
Admittance Spectroscopy on Irradiated GaAs Component Cells: Defect Analysis and Characterization
UL https://suche.suub.uni-bremen.de/peid=ieee-9300890&Exemplar=1&LAN=DE A1 Pellegrino, Carmine A1 Gagliardi, Alessio A1 Zimmermann, Claus G. YR 2020 K1 Gallium arsenide K1 Capacitance K1 Frequency measurement K1 Temperature measurement K1 Admittance K1 Protons K1 Photovoltaic cells K1 admittance spectroscopy K1 GaAs solar cell K1 displacement damage dose K1 irradiation-induced defect K1 hetero-barrier SP 0156 OP 0159 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9300890 DO https://doi.org/10.1109/PVSC45281.2020.9300890 SF ELIB - SuUB Bremen
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