I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Durability Performance Testing of SiC Diodes for use as Byp..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Hamada, Toshiyuki
;
Kashiwaya, Takumi
;
Yoneda, Shinnosuke
. - p. 2380-2383 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9301010
RT T1
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
: T1
Durability Performance Testing of SiC Diodes for use as Bypass Diodes in Photovoltaic Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-9301010&Exemplar=1&LAN=DE A1 Hamada, Toshiyuki A1 Kashiwaya, Takumi A1 Yoneda, Shinnosuke A1 Nakamoto, Kenta YR 2020 K1 Schottky diodes K1 Surges K1 Schottky barriers K1 Photovoltaic systems K1 Temperature measurement K1 Circuit faults K1 Lightning K1 photovoltaic system (PVS) K1 bypass diode (BPD) K1 SiC K1 schottky barrier diode K1 durability performance test SP 2380 OP 2383 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9301010 DO https://doi.org/10.1109/PVSC45281.2020.9301010 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)