I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Local Resistance Measurement for Degradation of c-Si Hetero..:
, In:
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
,
Jiang, Chun-Sheng
;
Sulas-Kern, Dana.B.
;
Moutinho, Helio R.
... - p. 1697-1701 , 2020
Link:
https://doi.org/10.1109/PVSC45281.2020.9301011
RT T1
2020 47th IEEE Photovoltaic Specialists Conference (PVSC)
: T1
Local Resistance Measurement for Degradation of c-Si Heterojunction with Intrinsic Thin Layer (HIT) Solar Modules
UL https://suche.suub.uni-bremen.de/peid=ieee-9301011&Exemplar=1&LAN=DE A1 Jiang, Chun-Sheng A1 Sulas-Kern, Dana.B. A1 Moutinho, Helio R. A1 Jordan, Dirk C. A1 Xiao, Chuanxiao A1 Johnston, Steve A1 Al-Jassim, Mowafak M. YR 2020 K1 Resistance K1 Electrical resistance measurement K1 Probes K1 Degradation K1 Current measurement K1 Area measurement K1 Solar power generation K1 Heterojunction with intrinsic thin layers (HIT) solar cells K1 solar module degradation K1 series resistance K1 scanning spreading resistance microscopy (SSRM) K1 atomic force microscopy (AFM) SP 1697 OP 1701 LK http://dx.doi.org/https://doi.org/10.1109/PVSC45281.2020.9301011 DO https://doi.org/10.1109/PVSC45281.2020.9301011 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)