I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Stress Evolution Analysis of EM-Induced Void Growth for Mul..:

, In: 2020 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS),
Liu, Zaiyong ; Chen, Hai-Bao ; Hou, Tianshu - p. 62-65 , 2020
Link: https://doi.org/10.1109/APCCAS50809.2020.9301690