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Raman Scattering Method to Measure and Improve the GaN Epit..:

, In: 2020 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE),
Lee, Chen-Che ; Lee, Hsin-Che ; Lee, Hsin-Jung.. - p. 149-151 , 2020
Link: https://doi.org/10.1109/ECICE50847.2020.9301986