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1 Ergebnisse
1
Systematic Software Testing of Critical Embedded Digital De..:
, In:
2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)
,
Jayakumar, Athira Varma
;
Gautham, Smitha
;
Kuhn, Richard
... - p. 85-90 , 2020
Link:
https://doi.org/10.1109/ISSREW51248.2020.00042
RT T1 <cTitle>2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW)</cTitle>: T1 <Title>Systematic Software Testing of Critical Embedded Digital Devices in Nuclear Power Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9307678&Exemplar=1&LAN=DE A1 Jayakumar, Athira Varma A1 Gautham, Smitha A1 Kuhn, Richard A1 Simons, Brandon A1 Collins, Aidan A1 Dirsch, Thomas A1 Kacker, Raghu A1 Elks, Carl YR 2020 K1 Testing K1 Software K1 Systematics K1 Tools K1 Real-time systems K1 Intelligent sensors K1 Hardware K1 t-way combinatoric testing K1 Pseudo Exhaustive testing K1 software testing K1 safety critical systems K1 embedded digital devices SP 85 OP 90 LK http://dx.doi.org/https://doi.org/10.1109/ISSREW51248.2020.00042 DO https://doi.org/10.1109/ISSREW51248.2020.00042 SF ELIB - SuUB Bremen
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