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1 Ergebnisse
1
An investigation of Near-field Radiated Emission for Silico..:
, In:
2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)
,
Zhang, Maosheng
;
Ren, Na
;
Guo, Qing
.. - p. 85-89 , 2020
Link:
https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308754
RT T1 <cTitle>2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)</cTitle>: T1 <Title>An investigation of Near-field Radiated Emission for Silicon Carbide Power Module in Buck Converter</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9308754&Exemplar=1&LAN=DE A1 Zhang, Maosheng A1 Ren, Na A1 Guo, Qing A1 Yao, Wenxi A1 Sheng, Kuang YR 2020 K1 Multichip modules K1 Silicon carbide K1 Buck converters K1 Transient analysis K1 Switching frequency K1 Switches K1 Graphical models SP 85 OP 89 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308754 DO https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308754 SF ELIB - SuUB Bremen
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