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Research and development of intelligent headlight test syst..:
, In:
2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)
,
Mingqing, Pan
;
Liang, Deng
;
Ru, Li
. - p. 140-143 , 2020
Link:
https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308790
RT T1 <cTitle>2020 17th China International Forum on Solid State Lighting & 2020 International Forum on Wide Bandgap Semiconductors China (SSLChina: IFWS)</cTitle>: T1 <Title>Research and development of intelligent headlight test system based on machine vision</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9308790&Exemplar=1&LAN=DE A1 Mingqing, Pan A1 Liang, Deng A1 Ru, Li A1 Mengping, Xue YR 2020 K1 Light emitting diodes K1 Lighting K1 Machine vision K1 Shape K1 Image edge detection K1 Corrosion K1 Cameras K1 Intelligent headlight K1 Matrix LED headlight K1 Image processing K1 Automatic test system SP 140 OP 143 LK http://dx.doi.org/https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308790 DO https://doi.org/10.1109/SSLChinaIFWS51786.2020.9308790 SF ELIB - SuUB Bremen
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