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On the impact of Gate field-plate length and barrier layer ..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Lin, Chien-Yu ; Putcha, Vamsi ; Alian, Alireza... - p. 1-7 , 2020
Link: https://doi.org/10.1109/IIRW49815.2020.9312857