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Points-Over-Threshold Statistics for Post-Retention Read Di..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Zambelli, Cristian ; Crippa, Luca ; Micheloni, Rino. - p. 1-5 , 2020
Link: https://doi.org/10.1109/IIRW49815.2020.9312860