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1 Ergebnisse
1
Deep Learning Analysis of 3D X-ray Images for Automated Obj..:
, In:
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)
,
Pahwa, Ramanpreet
;
Nwe, Tin Lay
;
Chang, Richard
... - p. 221-227 , 2020
Link:
https://doi.org/10.1109/EPTC50525.2020.9315043
RT T1 <cTitle>2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)</cTitle>: T1 <Title>Deep Learning Analysis of 3D X-ray Images for Automated Object Detection and Attribute Measurement of Buried Package Features</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9315043&Exemplar=1&LAN=DE A1 Pahwa, Ramanpreet A1 Nwe, Tin Lay A1 Chang, Richard A1 Jie, Wang A1 Min, Oo Zaw A1 Ho, Soon Wee A1 Qin, Ren A1 Rao, Vempati Srinivasa A1 Yang, Yanjing A1 Neumann, Jens Timo A1 Pichumani, Ramani A1 Gregorich, Tom YR 2020 K1 Three-dimensional displays K1 Through-silicon vias K1 Two dimensional displays K1 Object detection K1 X-ray imaging K1 Annotations K1 Tools SP 221 OP 227 LK http://dx.doi.org/https://doi.org/10.1109/EPTC50525.2020.9315043 DO https://doi.org/10.1109/EPTC50525.2020.9315043 SF ELIB - SuUB Bremen
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