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1
Practical characterization of micro fine RDL failure on PLP:
, In:
2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)
,
Gunji, Keita
;
Takagi, Noriaki
;
Hibarino, Toshihisa
. - p. 233-236 , 2020
Link:
https://doi.org/10.1109/EPTC50525.2020.9315180
RT T1 <cTitle>2020 IEEE 22nd Electronics Packaging Technology Conference (EPTC)</cTitle>: T1 <Title>Practical characterization of micro fine RDL failure on PLP</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9315180&Exemplar=1&LAN=DE A1 Gunji, Keita A1 Takagi, Noriaki A1 Hibarino, Toshihisa A1 Tsumura, Keiichi YR 2020 K1 Capacitance K1 Capacitance measurement K1 Transmission line measurements K1 Dispersion K1 Standards K1 Conferences K1 Position measurement SP 233 OP 236 LK http://dx.doi.org/https://doi.org/10.1109/EPTC50525.2020.9315180 DO https://doi.org/10.1109/EPTC50525.2020.9315180 SF ELIB - SuUB Bremen
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