I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Physical Analysis of Non-monotonic DIBL Dependence on Back ..:
, In:
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
,
Dabhi, Chetan Kumar
;
Kushwaha, Pragya
;
Agarwal, Harshit
... - p. 1-3 , 2019
Link:
https://doi.org/10.1109/S3S46989.2019.9320666
RT T1
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
: T1
Physical Analysis of Non-monotonic DIBL Dependence on Back Gate Bias in Thick Front Gate Oxide FDSOI MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-9320666&Exemplar=1&LAN=DE A1 Dabhi, Chetan Kumar A1 Kushwaha, Pragya A1 Agarwal, Harshit A1 Chauhan, Sarvesh S. A1 Hu, Chenming A1 Chauhan, Yogesh Singh YR 2019 K1 Threshold voltage K1 Logic gates K1 Silicon-on-insulator K1 Electric potential K1 Electron devices K1 Data models K1 Transistors K1 Fully Depleted Silicon On Insulator K1 FDSOI K1 UTBSOI K1 DIBL K1 fringing field K1 threshold voltage SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/S3S46989.2019.9320666 DO https://doi.org/10.1109/S3S46989.2019.9320666 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)