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1 Ergebnisse
1
HfZrO Ferroelectric Characterization and Parameterization o..:
, In:
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
,
Alam, Md Nur K.
;
Thesberg, M.
;
Kaczer, B.
... - p. 1-3 , 2019
Link:
https://doi.org/10.1109/S3S46989.2019.9320678
RT T1
2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
: T1
HfZrO Ferroelectric Characterization and Parameterization of Response to Arbitrary Excitation Waveform
UL https://suche.suub.uni-bremen.de/peid=ieee-9320678&Exemplar=1&LAN=DE A1 Alam, Md Nur K. A1 Thesberg, M. A1 Kaczer, B. A1 Roussel, Ph. A1 Vermeulen, B. A1 Truijen, B. A1 Popovici, M. I. A1 Ragnarsson, L.-A. A1 Verhulst, A. S. A1 Horiguchi, N. A1 Heyns, M. A1 Van Houdt, J. YR 2019 K1 Iron K1 Switches K1 Capacitors K1 Steady-state K1 Velocity measurement K1 Integrated circuit modeling K1 Data models K1 HfZrO K1 Ferroelectric K1 Switching speed K1 coercive field distribution K1 FORC K1 NLS model K1 Preisach model SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/S3S46989.2019.9320678 DO https://doi.org/10.1109/S3S46989.2019.9320678 SF ELIB - SuUB Bremen
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