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Thermal Noise-Induced Error Simulation Framework for Subthr..:

, In: 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S),
Rezaei, Elahe ; Donato, Marco ; Patterson, William.. - p. 1-3 , 2019
Link: https://doi.org/10.1109/S3S46989.2019.9320728