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1
Characterization of EM faults on ATmega328p:
, In:
2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)
,
Beckers, Arthur
;
Balasch, Josep
;
Gierlichs, Benedikt
... - p. 1-4 , 2019
Link:
https://doi.org/10.23919/EMCSapporo/APEMC44270.2019.93..
RT T1 <cTitle>2019 Joint International Symposium on Electromagnetic Compatibility, Sapporo and Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Sapporo/APEMC)</cTitle>: T1 <Title>Characterization of EM faults on ATmega328p</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9320849&Exemplar=1&LAN=DE A1 Beckers, Arthur A1 Balasch, Josep A1 Gierlichs, Benedikt A1 Verbauwhede, Ingrid A1 Osuka, Saki A1 Kinugawa, Masahiro A1 Fujimoto, Daisuke A1 Hayashi, Yuichi YR 2019 K1 Circuit faults K1 Semiconductor lasers K1 Probes K1 Clocks K1 Laser modes K1 Registers K1 Microcontrollers SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.23919/EMCSapporo/APEMC44270.2019.9320849 DO https://doi.org/10.23919/EMCSapporo/APEMC44270.2019.9320849 SF ELIB - SuUB Bremen
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