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1 Ergebnisse
1
Die-to-Die Testing and ECC Error Mitigation in Automotive a..:
, In:
2020 IEEE International Test Conference (ITC)
,
Boschi, Gabriele
;
Spano, Elisa
;
Grigoryan, Hayk
.. - p. 1-6 , 2020
Link:
https://doi.org/10.1109/ITC44778.2020.9325242
RT T1
2020 IEEE International Test Conference (ITC)
: T1
Die-to-Die Testing and ECC Error Mitigation in Automotive and Industrial Safety Applications
UL https://suche.suub.uni-bremen.de/peid=ieee-9325242&Exemplar=1&LAN=DE A1 Boschi, Gabriele A1 Spano, Elisa A1 Grigoryan, Hayk A1 Kumar, Arun A1 Harutyunyan, Gurgen YR 2020 SN 2378-2250 K1 Error correction codes K1 Circuit faults K1 Random access memory K1 Reliability K1 Safety K1 Manufacturing K1 Integrated circuit modeling K1 DRAM K1 safety K1 reliability K1 automotive K1 FIT rate K1 ECC K1 die-to-die testing SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/ITC44778.2020.9325242 DO https://doi.org/10.1109/ITC44778.2020.9325242 SF ELIB - SuUB Bremen
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