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Identification of stable irradiation-induced-defects using ..:
, In:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Germanicus, R. Coq
;
Cretu, B.
;
Touboul, A. D.
... - p. 1-4 , 2018
Link:
https://doi.org/10.1109/RADECS45761.2018.9328657
RT T1 <cTitle>2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Identification of stable irradiation-induced-defects using low frequency noise spectroscopy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9328657&Exemplar=1&LAN=DE A1 Germanicus, R. Coq A1 Cretu, B. A1 Touboul, A. D. A1 Grygiel, C. A1 Bezerra, F. A1 Rolland, G. A1 Lallemand, F. A1 Bunel, C. A1 Descamps, P. YR 2018 SN 1609-0438 K1 Low-frequency noise K1 Protons K1 Silicon K1 Noise measurement K1 Frequency measurement K1 Thermal noise K1 Temperature measurement K1 Radiation effects K1 protons K1 displacement damage K1 low frequency noise spectroscopy K1 stable traps SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS45761.2018.9328657 DO https://doi.org/10.1109/RADECS45761.2018.9328657 SF ELIB - SuUB Bremen
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