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1 Ergebnisse
1
TID Effects on Soft-breakdown and Self-heating Characterist..:
, In:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Shu, Lei
;
Wang, Liang
;
Zhou, Xin
... - p. 1-4 , 2018
Link:
https://doi.org/10.1109/RADECS45761.2018.9328663
RT T1 <cTitle>2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>TID Effects on Soft-breakdown and Self-heating Characteristics of 400V SOI NLDMOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9328663&Exemplar=1&LAN=DE A1 Shu, Lei A1 Wang, Liang A1 Zhou, Xin A1 Li, Yuan A1 Li, Tong-De A1 Yuan, Zhang-Yi'an A1 Sui, Cheng-Long A1 Zhao, Yuan-Fu YR 2018 SN 1609-0438 K1 Radiation effects K1 Semiconductor device measurement K1 Electric fields K1 Current measurement K1 Temperature measurement K1 Degradation K1 Performance evaluation K1 Total dose K1 SOI NLDMOSFETs K1 SBD K1 SHE K1 TCAD simulations SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/RADECS45761.2018.9328663 DO https://doi.org/10.1109/RADECS45761.2018.9328663 SF ELIB - SuUB Bremen
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