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Experimental Study of the NIEL Scaling for Silicon Devices:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Nuns, T. ; Inguimbert, C. ; Soonckindt, S.... - p. 1-8 , 2018
Link: https://doi.org/10.1109/RADECS45761.2018.9328677