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1
Single-Event Transients in a PIN Photodiode and a Single-Ph..:
, In:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Hofbauer, Michael
;
Steindl, Bernhard
;
Schneider-Hornstein, Kerstin
... - p. 1-5 , 2018
Link:
https://doi.org/10.1109/RADECS45761.2018.9328700
RT T1 <cTitle>2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS)</cTitle>: T1 <Title>Single-Event Transients in a PIN Photodiode and a Single-Photon Avalanche Diode Integrated in 0.35μm CMOS</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9328700&Exemplar=1&LAN=DE A1 Hofbauer, Michael A1 Steindl, Bernhard A1 Schneider-Hornstein, Kerstin A1 Goll, Bernhard A1 Voss, Kay-Obbe A1 Zimmermann, Horst YR 2018 SN 1609-0438 K1 Single-photon avalanche diodes K1 PIN photodiodes K1 Ions K1 Transient analysis K1 Photonics K1 Oscilloscopes K1 Epitaxial layers K1 single-event transient (SET) K1 PIN photodiode K1 single-photon avalanche diode (SPAD) K1 avalanche photo diode (APD) K1 heavy ions K1 micro-beam K1 CMOS SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/RADECS45761.2018.9328700 DO https://doi.org/10.1109/RADECS45761.2018.9328700 SF ELIB - SuUB Bremen
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