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1 Ergebnisse
1
A New Screening Method for Alleviating Transient Current Im..:
, In:
2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE)
,
Liu, Yizhe
;
Dai, Xiaoping
;
Jiang, Xi
... - p. 1-6 , 2020
Link:
https://doi.org/10.1109/CIYCEE49808.2020.9332642
RT T1 <cTitle>2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE)</cTitle>: T1 <Title>A New Screening Method for Alleviating Transient Current Imbalance of Paralleled SiC MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9332642&Exemplar=1&LAN=DE A1 Liu, Yizhe A1 Dai, Xiaoping A1 Jiang, Xi A1 Zeng, Zhong A1 Qi, Fang A1 Liu, Yang A1 Ke, Pan A1 Wang, Yongzhi A1 Wang, Jun YR 2020 K1 MOSFET K1 Inductance K1 Silicon carbide K1 Layout K1 Threshold voltage K1 Transient analysis K1 Transconductance K1 Classification K1 current sharing K1 SiC MOSFET K1 parallel-connection K1 layout mismatch SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/CIYCEE49808.2020.9332642 DO https://doi.org/10.1109/CIYCEE49808.2020.9332642 SF ELIB - SuUB Bremen
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