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1 Ergebnisse
1
Test Research on Poor Contact Defect Detection of GIS Based..:
, In:
2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE)
,
Li, Min
;
Bai, Jichang
;
Xia, Haotian
... - p. 1-5 , 2020
Link:
https://doi.org/10.1109/CIYCEE49808.2020.9332738
RT T1 <cTitle>2020 IEEE 1st China International Youth Conference on Electrical Engineering (CIYCEE)</cTitle>: T1 <Title>Test Research on Poor Contact Defect Detection of GIS Based on Temperature and Vibration</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9332738&Exemplar=1&LAN=DE A1 Li, Min A1 Bai, Jichang A1 Xia, Haotian A1 Xu, Leran A1 Ding, Dengwei A1 Ren, Chengjun YR 2020 K1 Vibrations K1 Temperature sensors K1 Temperature measurement K1 Contacts K1 Power transmission K1 Vibration measurement K1 Reliability K1 GIS K1 Conductive loop K1 Poor contact K1 Temperature K1 Vibration SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/CIYCEE49808.2020.9332738 DO https://doi.org/10.1109/CIYCEE49808.2020.9332738 SF ELIB - SuUB Bremen
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