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1 Ergebnisse
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Global Assessment of PA variability through concurrent Phys..:
, In:
2020 15th European Microwave Integrated Circuits Conference (EuMIC)
,
Guerrieri, S. Donati
;
Ramella, C.
;
Bonani, F.
. - p. 213-216 , 2021
Link:
https://doi.org/10.1109/EuMIC48047.2021.00065
RT T1 <cTitle>2020 15th European Microwave Integrated Circuits Conference (EuMIC)</cTitle>: T1 <Title>Global Assessment of PA variability through concurrent Physics-based X-parameter and Electro-Magnetic simulations</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9337312&Exemplar=1&LAN=DE A1 Guerrieri, S. Donati A1 Ramella, C. A1 Bonani, F. A1 Ghione, G. YR 2021 K1 Microwave integrated circuits K1 Gallium arsenide K1 Power amplifiers K1 Semiconductor process modeling K1 Scattering parameters K1 Integrated circuit modeling K1 Power generation K1 Device variability K1 microwave amplifiers K1 X parameters SP 213 OP 216 LK http://dx.doi.org/https://doi.org/10.1109/EuMIC48047.2021.00065 DO https://doi.org/10.1109/EuMIC48047.2021.00065 SF ELIB - SuUB Bremen
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