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Deep Learning-Based Autonomous Scanning Electron Microscope:

, In: 2020 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS),
Jang, Jonggyu ; Lyu, Hyeonsu ; Yang, Hyun Jong.. - p. 2886-2893 , 2020
Link: https://doi.org/10.1109/IROS45743.2020.9341041