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Characterization of Dielectric Walls of Capacitors:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Gnonhoue, O. G. ; Velazquez-Salazar, A. ; Millard, L.... - p. 653-656 , 2020
Link: https://doi.org/10.1109/ICD46958.2020.9341843