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Combined-PSD and LIMM Measurements for Traps Characterizati..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Boudou, L. ; Berquez, L. ; Teyssedre, G. - p. 371-374 , 2020
Link: https://doi.org/10.1109/ICD46958.2020.9341904