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Charge Accumulation at High DC Voltage and Superimposed Med..:

, In: 2020 IEEE 3rd International Conference on Dielectrics (ICD),
Seifert, F. ; Porizka, I. ; Leu, C. - p. 333-337 , 2020
Link: https://doi.org/10.1109/ICD46958.2020.9341963