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1 Ergebnisse
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Characterization of Al-foil/p -4H-SiC SBDs Fabricated by DW..:
, In:
2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
,
Ziko, Mehadi Hasan
;
Koel, Ants
;
Rang, Toomas
- p. 1-5 , 2020
Link:
https://doi.org/10.1109/WiPDAAsia49671.2020.9360265
RT T1
2020 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia (WiPDA Asia)
: T1
Characterization of Al-foil/p -4H-SiC SBDs Fabricated by DW with Variation of Process Conditions
UL https://suche.suub.uni-bremen.de/peid=ieee-9360265&Exemplar=1&LAN=DE A1 Ziko, Mehadi Hasan A1 Koel, Ants A1 Rang, Toomas YR 2020 K1 Temperature measurement K1 Schottky diodes K1 Semiconductor device measurement K1 Temperature K1 Manufacturing processes K1 Silicon carbide K1 Welding K1 Schottky barriers K1 Doping K1 Nonhomogeneous media K1 Silicon Carbide K1 Diffusion Welding K1 Schottky Barrier diode K1 Barrier height K1 I–V K1 C–V SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/WiPDAAsia49671.2020.9360265 DO https://doi.org/10.1109/WiPDAAsia49671.2020.9360265 SF ELIB - SuUB Bremen
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