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1 Ergebnisse
1
Characterization of midgap tungsten gate MOSFETs:
, In:
Device Research Conference. Conference Digest (Cat. No.01TH8561)
,
Huiling Shang
;
White, M.H.
;
Guarini, K.W.
.. - p. 73 , 2001
Link:
https://doi.org/10.1109/DRC.2001.937878
RT T1
Device Research Conference. Conference Digest (Cat. No.01TH8561)
: T1
Characterization of midgap tungsten gate MOSFETs
UL https://suche.suub.uni-bremen.de/peid=ieee-937878&Exemplar=1&LAN=DE A1 Huiling Shang A1 White, M.H. A1 Guarini, K.W. A1 Cartier, E. A1 Solomon, P. YR 2001 K1 Tungsten K1 MOSFETs K1 Chemical vapor deposition K1 Conductivity K1 Dielectric thin films K1 MOS devices K1 Degradation K1 Marine vehicles K1 Aluminum K1 Electrodes SP 73 LK http://dx.doi.org/https://doi.org/10.1109/DRC.2001.937878 DO https://doi.org/10.1109/DRC.2001.937878 SF ELIB - SuUB Bremen
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