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1 Ergebnisse
1
Impact of Hot Carrier Stress on RF Power Characteristics of..:
, In:
IEEE MTT-S International Microwave Symposium Digest, 2005.
,
Huang, Sheng-Yi
;
Chen, Kun-Ming
;
Huang, Guo-Wei
... - p. 161-164 , 2005
Link:
https://doi.org/10.1109/MWSYM.2005.1516548
RT T1 <cTitle>IEEE MTT-S International Microwave Symposium Digest, 2005.</cTitle>: T1 <Title>Impact of Hot Carrier Stress on RF Power Characteristics of MOSFETs</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9387819&Exemplar=1&LAN=DE A1 Huang, Sheng-Yi A1 Chen, Kun-Ming A1 Huang, Guo-Wei A1 Yang, Dao-Yen A1 Chang, Chun-Yen A1 Liang, Victor A1 Tseng, Hua-Chou YR 2005 SN 0149-645X K1 Radio frequency K1 Degradation K1 MOSFET K1 Linearity K1 Logic gates K1 Threshold voltage K1 Stress K1 Hot-carrier stress K1 load-pull measurement K1 power K1 linearity SP 161 OP 164 LK http://dx.doi.org/https://doi.org/10.1109/MWSYM.2005.1516548 DO https://doi.org/10.1109/MWSYM.2005.1516548 SF ELIB - SuUB Bremen
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