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High-Q Resonators using FBAR/SAW Technology and their Appli..:
, In:
IEEE MTT-S International Microwave Symposium Digest, 2005.
,
Ueda, Masanori
;
Nishihara, Tokihiro
;
Tsutsumi, Jun
... - p. 209-212 , 2005
Link:
https://doi.org/10.1109/MWSYM.2005.1516561
RT T1 <cTitle>IEEE MTT-S International Microwave Symposium Digest, 2005.</cTitle>: T1 <Title>High-Q Resonators using FBAR/SAW Technology and their Applications</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9387940&Exemplar=1&LAN=DE A1 Ueda, Masanori A1 Nishihara, Tokihiro A1 Tsutsumi, Jun A1 Taniguchi, Shinji A1 Yokoyama, Tsuyoshi A1 Inoue, Shogo A1 Miyashita, Tsutomu A1 Satoh, Yoshio YR 2005 SN 0149-645X K1 Electrodes K1 Surface acoustic waves K1 Resonator filters K1 Spread spectrum communication K1 Film bulk acoustic resonators K1 Resonators K1 Microwave filters K1 FBAR K1 SAW K1 resonator K1 Q-factor K1 AIN K1 Ru K1 filter K1 duplexer SP 209 OP 212 LK http://dx.doi.org/https://doi.org/10.1109/MWSYM.2005.1516561 DO https://doi.org/10.1109/MWSYM.2005.1516561 SF ELIB - SuUB Bremen
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