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Role of the AlGaN Cap Layer on the Trapping Behaviour of N-..:

, In: 2021 IEEE International Reliability Physics Symposium (IRPS),
Chiocchetta, F. ; Calascione, C. ; De Santi, C.... - p. 1-2 , 2021
Link: https://doi.org/10.1109/IRPS46558.2021.9405111