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1 Ergebnisse
1
Study on the Guard Rings for Latchup Prevention between HV-..:
, In:
2021 IEEE International Reliability Physics Symposium (IRPS)
,
Chen, Chao-Yang
;
Lee, Jian-Hsing
;
Nidhi, Karuna
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/IRPS46558.2021.9405113
RT T1 <cTitle>2021 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>Study on the Guard Rings for Latchup Prevention between HV-PMOS and LV-PMOS in a 0.15-µm BCD Process</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9405113&Exemplar=1&LAN=DE A1 Chen, Chao-Yang A1 Lee, Jian-Hsing A1 Nidhi, Karuna A1 Bin, Tzer-Yaa A1 Lin, Geeng-Lih A1 Ker, Ming-Dou YR 2021 SN 1938-1891 K1 Integrated circuits K1 Low voltage K1 Reliability engineering K1 Foundries K1 Integrated circuit reliability K1 Physics K1 Latchup K1 Guard Rings K1 Latchup Prevention K1 High-Voltage CMOS K1 bipolar-CMOS-DMOS (BCD) process SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IRPS46558.2021.9405113 DO https://doi.org/10.1109/IRPS46558.2021.9405113 SF ELIB - SuUB Bremen
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