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1 Ergebnisse
1
Frequency, LET, and Supply Voltage Dependence of Logic Soft..:
, In:
2021 IEEE International Reliability Physics Symposium (IRPS)
,
Xiong, Y.
;
Feeley, A.
;
Massengill, L.W.
... - p. 1-5 , 2021
Link:
https://doi.org/10.1109/IRPS46558.2021.9405128
RT T1
2021 IEEE International Reliability Physics Symposium (IRPS)
: T1
Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node
UL https://suche.suub.uni-bremen.de/peid=ieee-9405128&Exemplar=1&LAN=DE A1 Xiong, Y. A1 Feeley, A. A1 Massengill, L.W. A1 Bhuva, B.L. A1 Wen, S.-J. A1 Fung, R. YR 2021 SN 1938-1891 K1 Latches K1 Logic circuits K1 Predictive models K1 Shift registers K1 Reliability engineering K1 Transistors K1 Transient analysis K1 Single Event Upset K1 Logic Single Event Errors K1 FinFET Technology SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS46558.2021.9405128 DO https://doi.org/10.1109/IRPS46558.2021.9405128 SF ELIB - SuUB Bremen
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