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1 Ergebnisse
1
HCI Temperature sense effect from 180nm to 28nm nodes:
, In:
2021 IEEE International Reliability Physics Symposium (IRPS)
,
Federspiel, X.
;
Camara, A.
;
Michard, A.
.. - p. 1-5 , 2021
Link:
https://doi.org/10.1109/IRPS46558.2021.9405146
RT T1 <cTitle>2021 IEEE International Reliability Physics Symposium (IRPS)</cTitle>: T1 <Title>HCI Temperature sense effect from 180nm to 28nm nodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9405146&Exemplar=1&LAN=DE A1 Federspiel, X. A1 Camara, A. A1 Michard, A. A1 Diouf, C. A1 Cacho, F. YR 2021 SN 1938-1891 K1 Temperature measurement K1 Temperature sensors K1 Semiconductor device modeling K1 MOSFET K1 Voltage measurement K1 Measurement uncertainty K1 Reliability K1 CMOS reliability K1 hot carrier K1 temperature activation K1 self-heating SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS46558.2021.9405146 DO https://doi.org/10.1109/IRPS46558.2021.9405146 SF ELIB - SuUB Bremen
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