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1 Ergebnisse
1
Secured Test Pattern Generators for BIST:
, In:
2021 5th International Conference on Computing Methodologies and Communication (ICCMC)
,
Shanmukha Naga Naidu, P.
;
Naga Sumanth, B.
;
Sri Ram Koduri, Pavan
... - p. 542-546 , 2021
Link:
https://doi.org/10.1109/ICCMC51019.2021.9418431
RT T1
2021 5th International Conference on Computing Methodologies and Communication (ICCMC)
: T1
Secured Test Pattern Generators for BIST
UL https://suche.suub.uni-bremen.de/peid=ieee-9418431&Exemplar=1&LAN=DE A1 Shanmukha Naga Naidu, P. A1 Naga Sumanth, B. A1 Sri Ram Koduri, Pavan A1 Sri Ram Teja, M. A1 Remadevi Somanathan, Geethu A1 Bhakthavatchalu, Ramesh YR 2021 K1 Integrated circuits K1 Privacy K1 Side-channel attacks K1 Intellectual property K1 Built-in self-test K1 Hardware K1 Design for testability K1 Hardware security K1 Logic locking K1 TPG K1 BIST K1 Reverse engineering K1 Overproduction SP 542 OP 546 LK http://dx.doi.org/https://doi.org/10.1109/ICCMC51019.2021.9418431 DO https://doi.org/10.1109/ICCMC51019.2021.9418431 SF ELIB - SuUB Bremen
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