I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Secured Test Pattern Generators for BIST:

, In: 2021 5th International Conference on Computing Methodologies and Communication (ICCMC),
Shanmukha Naga Naidu, P. ; Naga Sumanth, B. ; Sri Ram Koduri, Pavan... - p. 542-546 , 2021
Link: https://doi.org/10.1109/ICCMC51019.2021.9418431