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Demonstration of a Fast, Low-Voltage, III-V Semiconductor, ..:
, In:
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
,
Lane, Dominic
;
Hodgson, Peter
;
Potter, Richard
. - p. 1-3 , 2021
Link:
https://doi.org/10.1109/EDTM50988.2021.9420825
RT T1 <cTitle>2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)</cTitle>: T1 <Title>Demonstration of a Fast, Low-Voltage, III-V Semiconductor, Non-Volatile Memory</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9420825&Exemplar=1&LAN=DE A1 Lane, Dominic A1 Hodgson, Peter A1 Potter, Richard A1 Hayne, Manus YR 2021 K1 Degradation K1 Temperature distribution K1 Nonvolatile memory K1 Random access memory K1 Switches K1 Logic gates K1 Resonant tunneling devices SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDTM50988.2021.9420825 DO https://doi.org/10.1109/EDTM50988.2021.9420825 SF ELIB - SuUB Bremen
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