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Design of 2xVDD-Tolerant Power-Rail ESD Clamp Circuit Again..:

, In: 2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT),
Huang, Han-Sheng ; Ker, Ming-Dou - p. 1-4 , 2021
Link: https://doi.org/10.1109/VLSI-DAT52063.2021.9427327