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1 Ergebnisse
1
Chip Performance Prediction Using Machine Learning Techniqu..:
, In:
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Su, Min-Yan
;
Lin, Wei-Chen
;
Kuo, Yen-Ting
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/VLSI-DAT52063.2021.9427338
RT T1
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
Chip Performance Prediction Using Machine Learning Techniques
UL https://suche.suub.uni-bremen.de/peid=ieee-9427338&Exemplar=1&LAN=DE A1 Su, Min-Yan A1 Lin, Wei-Chen A1 Kuo, Yen-Ting A1 Li, Chien-Mo A1 Fang, Eric Jia-Wei A1 Hsueh, Sung S.-Y. YR 2021 SN 2472-9124 K1 Ring oscillators K1 Industries K1 Training K1 Structural rings K1 Semiconductor device measurement K1 Linear regression K1 Machine learning K1 Process variation K1 Chip performance K1 Speed binning SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT52063.2021.9427338 DO https://doi.org/10.1109/VLSI-DAT52063.2021.9427338 SF ELIB - SuUB Bremen
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