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1 Ergebnisse
1
Intelligence Everywhere: The Challenges and Opportunities f..:
, In:
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
,
Chen, Pin-Han
- p. 1-2 , 2021
Link:
https://doi.org/10.1109/VLSI-DAT52063.2021.9427341
RT T1
2021 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
: T1
Intelligence Everywhere: The Challenges and Opportunities for Semiconductor Designs
UL https://suche.suub.uni-bremen.de/peid=ieee-9427341&Exemplar=1&LAN=DE A1 Chen, Pin-Han YR 2021 SN 2472-9124 K1 Industries K1 Computer vision K1 Power demand K1 Design automation K1 Customer services K1 Life estimation K1 Very large scale integration K1 Deep learning K1 AI Accelerator K1 Memory-bound K1 Latency-bound K1 Energy-efficiency K1 Chiplet-based design SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-DAT52063.2021.9427341 DO https://doi.org/10.1109/VLSI-DAT52063.2021.9427341 SF ELIB - SuUB Bremen
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