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1
Determination of Carrier Lifetime in Silicon Using an Ultra..:
, In:
2021 IEEE Latin America Electron Devices Conference (LAEDC)
,
Yan, Yiyi
;
Flandre, Denis
;
Kilchytska, Valeriya
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/LAEDC51812.2021.9437934
RT T1 <cTitle>2021 IEEE Latin America Electron Devices Conference (LAEDC)</cTitle>: T1 <Title>Determination of Carrier Lifetime in Silicon Using an Ultra-thin Al2O3/SiO2 Dielectric Stack</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9437934&Exemplar=1&LAN=DE A1 Yan, Yiyi A1 Flandre, Denis A1 Kilchytska, Valeriya A1 Faniel, Sebastien A1 Tang, Xiaohui A1 Raskin, Jean-Pierre YR 2021 K1 Silicon compounds K1 Spontaneous emission K1 Photovoltaic cells K1 Silicon K1 Photodetectors K1 Dielectrics K1 Charge carrier lifetime K1 Effective carrier lifetime K1 ultra-thin dielectric stack K1 Al2O3/SiO2 K1 surface recombination velocity SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC51812.2021.9437934 DO https://doi.org/10.1109/LAEDC51812.2021.9437934 SF ELIB - SuUB Bremen
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