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Assessment of RF compact modelling of FD SOI transistors:
, In:
2021 IEEE Latin America Electron Devices Conference (LAEDC)
,
Vanbrabant, Martin
;
Nyssens, Lucas
;
Kilchytska, Valeriya
. - p. 1-3 , 2021
Link:
https://doi.org/10.1109/LAEDC51812.2021.9437955
RT T1
2021 IEEE Latin America Electron Devices Conference (LAEDC)
: T1
Assessment of RF compact modelling of FD SOI transistors
UL https://suche.suub.uni-bremen.de/peid=ieee-9437955&Exemplar=1&LAN=DE A1 Vanbrabant, Martin A1 Nyssens, Lucas A1 Kilchytska, Valeriya A1 Raskin, Jean-Pierre YR 2021 K1 Temperature measurement K1 Radio frequency K1 Temperature distribution K1 Predictive models K1 Capacitance K1 Frequency response K1 Frequency measurement K1 UTBB K1 FDSOI K1 self-heating K1 thermal impedance K1 substrate effect K1 Spectre simulations SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/LAEDC51812.2021.9437955 DO https://doi.org/10.1109/LAEDC51812.2021.9437955 SF ELIB - SuUB Bremen
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