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Comparison of 2-T FeFET Nonvolatile Memory Cells: Gate Sele..:

, In: 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA),
Huang, Bo-Kai ; You, Wei-Xiang ; Su, Pin - p. 1-2 , 2021
Link: https://doi.org/10.1109/VLSI-TSA51926.2021.9440073