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Effectively Sampling Higher Order Mutants Using Causal Effe..:

, In: 2021 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW),
Oh, Saeyoon ; Lee, Seongmin ; Yoo, Shin - p. 19-24 , 2021
Link: https://doi.org/10.1109/ICSTW52544.2021.00017