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1 Ergebnisse
1
A Discussion of Artificial Intelligence Applications in SiC..:
, In:
2021 IEEE International Electric Machines & Drives Conference (IEMDC)
,
Regatti, Jayanth Reddy
;
You, Haoyang
;
Wang, Han
... - p. 1-5 , 2021
Link:
https://doi.org/10.1109/IEMDC47953.2021.9449497
RT T1 <cTitle>2021 IEEE International Electric Machines & Drives Conference (IEMDC)</cTitle>: T1 <Title>A Discussion of Artificial Intelligence Applications in SiC MOSFET Device Operation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9449497&Exemplar=1&LAN=DE A1 Regatti, Jayanth Reddy A1 You, Haoyang A1 Wang, Han A1 Hall, Jon A1 Schnabel, Alec A1 Hu, Boxue A1 Zhang, Julia A1 Wang, Jin A1 Gupta, Abhishek YR 2021 K1 Degradation K1 MOSFET K1 Silicon carbide K1 Reinforcement learning K1 Life estimation K1 Artificial intelligence K1 Optimization K1 Topic-Remaining Useful Lifetime K1 Current Imbalance K1 Parallel SiC MOSFETs K1 Artificial Intelligence K1 Machine Learning K1 Reinforcement Learning SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IEMDC47953.2021.9449497 DO https://doi.org/10.1109/IEMDC47953.2021.9449497 SF ELIB - SuUB Bremen
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