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1 Ergebnisse
1
The impact of oxide layer width variation on the performanc..:
, In:
2021 Devices for Integrated Circuit (DevIC)
,
Tripathy, Dhananjaya
;
Rout, Prakash Kumar
;
Nayak, Debasish
.. - p. 577-580 , 2021
Link:
https://doi.org/10.1109/DevIC50843.2021.9455872
RT T1
2021 Devices for Integrated Circuit (DevIC)
: T1
The impact of oxide layer width variation on the performance parameters of FinFET
UL https://suche.suub.uni-bremen.de/peid=ieee-9455872&Exemplar=1&LAN=DE A1 Tripathy, Dhananjaya A1 Rout, Prakash Kumar A1 Nayak, Debasish A1 Biswal, Sudhansu Mohan A1 Singh, Nalini YR 2021 K1 Performance evaluation K1 Integrated circuits K1 Power demand K1 Computational modeling K1 Cutoff frequency K1 Bandwidth K1 FinFETs K1 Fin K1 GBW K1 cutoff frequency K1 power consumption SP 577 OP 580 LK http://dx.doi.org/https://doi.org/10.1109/DevIC50843.2021.9455872 DO https://doi.org/10.1109/DevIC50843.2021.9455872 SF ELIB - SuUB Bremen
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