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1 Ergebnisse
1
A Dynamic Sampling Algorithm Based on Cosrisk Assessment Mo..:
, In:
2021 China Semiconductor Technology International Conference (CSTIC)
,
Wang, Sen
;
Yan, Shijia
;
Li, Lei
... - p. 1-4 , 2021
Link:
https://doi.org/10.1109/CSTIC52283.2021.9461450
RT T1 <cTitle>2021 China Semiconductor Technology International Conference (CSTIC)</cTitle>: T1 <Title>A Dynamic Sampling Algorithm Based on Cosrisk Assessment Model in Semiconductor Manufacturing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9461450&Exemplar=1&LAN=DE A1 Wang, Sen A1 Yan, Shijia A1 Li, Lei A1 Luo, Cong A1 Ai, Juan A1 Shen, Qiang A1 Wang, Desheng A1 Ding, Shenglan A1 Xia, Qing YR 2021 K1 Semiconductor device modeling K1 Economics K1 Semiconductor device measurement K1 Measurement units K1 Heuristic algorithms K1 Current measurement K1 Process control SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/CSTIC52283.2021.9461450 DO https://doi.org/10.1109/CSTIC52283.2021.9461450 SF ELIB - SuUB Bremen
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