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Impact of Supply Noise on Nano-Meter VLSI Design: Hard or S..:

, In: 2021 China Semiconductor Technology International Conference (CSTIC),
Wen, Chenyi ; Cai, Yue ; Zhuo, Cheng - p. 1-4 , 2021
Link: https://doi.org/10.1109/CSTIC52283.2021.9461455