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1 Ergebnisse
1
Mission Profile Based Reliability Analysis of A Bridgeless ..:
, In:
2021 IEEE Applied Power Electronics Conference and Exposition (APEC)
,
Chen, Zhengge
;
Davari, Pooya
;
Wang, Huai
- p. 1815-1821 , 2021
Link:
https://doi.org/10.1109/APEC42165.2021.9487083
RT T1 <cTitle>2021 IEEE Applied Power Electronics Conference and Exposition (APEC)</cTitle>: T1 <Title>Mission Profile Based Reliability Analysis of A Bridgeless Boost PFC</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-9487083&Exemplar=1&LAN=DE A1 Chen, Zhengge A1 Davari, Pooya A1 Wang, Huai YR 2021 SN 2470-6647 K1 Semiconductor device measurement K1 Conferences K1 Capacitors K1 Prototypes K1 Power factor correction K1 Maintenance engineering K1 Reliability engineering K1 Bridgeless K1 PFC K1 telecom K1 mission profile K1 reliability analysis K1 wear-out region SP 1815 OP 1821 LK http://dx.doi.org/https://doi.org/10.1109/APEC42165.2021.9487083 DO https://doi.org/10.1109/APEC42165.2021.9487083 SF ELIB - SuUB Bremen
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